lsh775/moonbit_metrology/cmd/metrology

README
T
AcceptancePolicy
T
AdapterContract
T
AdapterKind
T
AuditEntry
T
AuditTrace
T
BatchQualityResult
T
BatchSummary
T
CapabilitySummary
T
Catalog
T
ControlLimits
T
DashboardCard
- ::can_measureDevice::can_measure
T
DeviceCandidate
T
DeviceProfile
T
Diagnostic
T
DiagnosticSeverity
T
DurationEstimate
T
EvidenceIndex
T
ExecutionPhase
T
Feature
T
FeatureKind
T
FeatureResult
T
MeasurementContext
T
MeasurementPlan
T
MeasurementProtocol
T
MeasurementStep
T
Observation
T
ObservationAnalysis
T
ObservationBatch
T
OptimizationGoal
T
OptimizationResult
T
ParsedFeatures
T
ParsedObservations
T
PlanExplanation
T
PlanMetrics
T
PlanPhase
T
PlanSummary
T
ProgramSummary
T
QualityDashboard
T
QualityDecision
T
QualityScore
T
QualityTrendSummary
T
ReadinessReport
T
ReleaseCheck
T
ReleaseGate
T
ReplayIssue
T
ReplayIssueKind
T
ReplayResult
T
ReportManifest
T
ResultCollection
T
RiskLevel
T
RiskMatrix
T
SchedulePolicy
T
ScheduledPlan
T
SelectionReason
T
Strategy
T
TraceEvent
T
TraceEventKind
T
TraceLog
T
TrendPoint
T
ValidationSummary
T
ValueQualityResult
T
Verdict
V
acceptance_policy
V
adapter_can_measure
V
adapter_contract
V
adapter_contract_is_valid
V
adapter_contract_summary
V
adapter_for_kind
V
adapter_is_online
V
adapter_kind_from_name
V
adapter_kind_intersection
V
adapter_name
V
adapter_priority
V
adapter_required_field_count
V
adapter_requires_calibration
V
adapter_selection_reason
V
adapter_supported_kind_count
V
adapter_supports_batch
V
adapters_overlap
V
all_adapter_kinds
V
all_feature_kinds
V
all_features_reachable
V
analysis_risk
V
analyze_observations
V
assess_readiness
V
audit_verdict_counts
V
average_step_duration
V
batch_is_clean
V
batch_size_is_valid
V
batch_trend
V
benchmark_devices
V
benchmark_feature_csv
V
benchmark_features
V
benchmark_observations
V
benchmark_plan
V
build_audit_trace
V
build_audit_trace_with_features
V
build_dashboard
V
build_evidence_index
V
build_report_manifest
V
build_risk_matrix
V
calibration_is_current
V
canonical_feature_line
V
canonical_observation_line
V
canonical_part_id
V
capability_indices
V
capability_is_acceptable
V
capability_margin
V
capability_ok
V
catalog_device_ids
V
catalog_feature_ids
V
catalog_from
V
catalog_is_valid
V
catalog_kind_count
V
choose_device
V
classify
V
collect_feature_results
V
compare_plans
V
confidence_label
V
control_limits
V
csv_diagnostics
V
dashboard_card_status
V
dashboard_card_value
V
dashboard_failure_count
V
dashboard_is_clean
V
dashboard_is_complete
V
dashboard_is_healthy
V
dashboard_status
V
dashboard_warning_count
V
datum_features
V
datum_step_ratio
V
default_acceptance_policy
V
default_direction_for_kind
V
default_risk_for_kind
V
default_schedule_policy
V
default_strategy_for_kind
V
defect_batch_count
V
device_can_cover_catalog
V
device_can_measure_with_profile
V
device_index
V
device_normalization_change_count
V
device_profile
V
device_profile_status
V
device_switch_count
V
device_transfer_seconds
V
diagnostic_codes
V
diagnostic_count
V
diagnostics_have_code
V
direction_change_count
V
duration_band
V
duration_efficiency
V
duration_fits
V
duration_has_replicates
V
duration_utilization
V
error_diagnostic
V
estimate_plan_duration
V
estimate_uncertainty
V
estimated_execution_seconds
V
evaluate_batch
V
evaluate_release_gate
V
evaluate_value
V
evidence_density
V
evidence_index_is_usable
V
evidence_index_pass_rate
V
evidence_is_complete
V
execution_order
V
execution_phases
V
explain_plan
V
export_batch_summary_csv
V
export_diagnostics_csv
V
export_features_csv
V
export_observations_csv
V
export_plan_csv
V
export_trace_csv
V
failed_release_check_count
V
failed_release_check_names
V
feature_fingerprint
V
feature_index
V
feature_kind_category
V
feature_kind_code
V
feature_kind_dimension
V
feature_kind_from_name
V
feature_kind_is_datum
V
feature_kind_is_rotational
V
feature_kind_is_surface
V
feature_kind_name
V
feature_result
V
features_of_kind
V
find_device
V
find_feature
V
grouped_execution_order
V
has_errors
V
high_risk_rate
V
highest_risk
V
ids_are_unique
V
invalid_sample_observation_count
V
is_canonical_catalog
V
is_non_decreasing
V
is_non_increasing
V
kind_requires_scan
V
kind_supports_touch_probe
V
kind_supports_vision
V
largest_batch_size
V
latest_trend_point
V
limit_margin
V
limit_position
V
low_risk_rate
V
lower_limit
V
manifest_counts_are_consistent
V
manifest_evidence_label
V
manifest_has_plan_for_features
V
manifest_is_attachable
V
manifest_is_publishable
V
manifest_missing_feature_count
V
manifest_readiness_reason
V
manifest_schema_is_current
V
manifest_step_density
V
matched_feature_count
V
maximum
V
maximum_step_duration
V
mean
V
measurement_time_ratio
V
minimum
V
missing_feature_ids
V
new_device
V
new_observation
V
normalization_change_count
V
normalization_changed
V
normalize_catalog
V
normalize_device
V
normalize_feature
V
normalize_identifier
V
normalize_observation
V
normalize_observations
V
observation_values_for
V
observations_for
V
optimization_delta
V
optimization_goal_text
V
optimization_improves
V
optimization_score
V
optimize_plan
V
optimized_batch_count
V
outlier_flags
V
pad_right
V
parse_feature_csv
V
parse_feature_csv_strict
V
parse_observation_csv_strict
V
pass_rate
V
passed_release_check_count
V
plan
V
plan_efficiency
V
plan_metrics
V
plan_quality
V
plan_waste_count
V
planned_sample_count
V
policy_accepts
V
policy_is_valid
V
population_stddev
V
profile_accuracy_rank
V
profile_capacity
V
profile_is_ready
V
profile_is_usable
V
profile_needs_recalibration
V
profile_reach_margin
V
profile_summary
V
profile_supported_kind_count
V
profile_unsupported_ids
V
profile_warning
V
program_cpk_margin
V
program_defect_rate
V
program_has_unmeasured
V
program_high_risk_count
V
program_is_acceptable
V
program_observation_count
V
program_pass_rate
V
program_status
V
protocol_accepts
V
protocol_check_count
V
protocol_from_plan
V
protocol_is_operational
V
protocol_risk
V
protocol_status
V
protocol_text
V
quality_decision_reason
V
quality_decision_text
V
range
V
rank_devices
V
readiness_catalog_is_valid
V
readiness_diagnostics
V
readiness_error_count
V
readiness_is_green
V
readiness_needs_review
V
readiness_plan_is_valid
V
readiness_status
V
readiness_warning_count
V
recommended_samples
V
rejected_explanation_count
V
relative_error
V
release_evidence_is_explained
V
release_gate_status
V
release_gate_text
V
render_audit_report
V
render_batch_summary
V
render_dashboard
V
render_dashboard_table
V
render_diagnostics
V
render_diagnostics_table
V
render_duration
V
render_evidence_index
V
render_key_values
V
render_metric
V
render_plan_table
V
render_readiness
V
render_replay_issues
V
render_report
V
render_result_collection
V
render_risk_matrix
V
render_text_table
V
render_trace_entries
V
render_trend_summary
V
repeat_count
V
repeated_measurement_consistent
V
repeated_step_count
V
replay_has_issue
V
replay_is_idempotent
V
replay_issue_count
V
replay_issue_kind_text
V
replay_plan
V
report_manifest_status
V
report_manifest_text
V
required_time_windows
V
residuals
V
resolve_strategy
V
result_count
V
result_coverage
V
result_for_feature
V
result_has_failure
V
result_high_risk_count
V
result_is_clean
V
result_is_complete
V
risk_for_uncertainty
V
risk_is_actionable
V
risk_level_score
V
risk_level_text
V
risk_matrix_is_clear
V
risk_matrix_needs_action
V
risk_matrix_status
V
rolling_defect_rates
V
rotational_kind_count
V
sample_count_is_valid
V
sample_stddev
V
schedule_establishes_datum
V
schedule_is_deterministic
V
schedule_plan
V
schedule_policy
V
scheduled_feature_ids
V
scheduled_sample_count
V
seconds_per_sample
V
selection_reason_text
V
signed_deviation
V
split_steps_into_batches
V
step_duration_seconds
V
step_setup_seconds
V
strategy_can_resolve
V
strategy_cost
V
strategy_duration_seconds
V
strategy_is_repeated
V
strategy_is_scan
V
strategy_name
V
strategy_risk
V
strategy_sample_count
V
summarize_batch
V
summarize_program
V
summarize_quality_trend
V
supported_devices
V
supported_feature_count
V
table_column_count
V
table_is_rectangular
V
tolerance_half_width
V
tolerance_is_valid
V
trace_append
V
trace_event_count
V
trace_event_kind_text
V
trace_feature_event_count
V
trace_feature_ids
V
trace_has_feature
V
trace_has_part
V
trace_has_warning
V
trace_is_complete
V
trace_log_from_plan
V
trace_step_indices
V
trace_summary
V
transfer_dominates
V
transfer_time_ratio
V
trend_direction
V
trend_is_within_limit
V
trend_point
V
truncate_text
V
uncertainty_ratio
V
unmeasurable_features
V
upper_limit
V
validate_batch_summary
V
validate_catalog
V
validate_device
V
validate_feature
V
validate_observations
V
validate_plan
V
validate_protocol
V
validation_can_plan
V
validation_status
V
validation_summary
V
value_failure_count
V
value_is_failure
V
value_needs_review
V
value_warning_count
V
verdict
V
verdict_code
V
verdict_is_failure
V
verdict_is_pass
V
verdict_reason
V
warning_diagnostic
V
within_control_limit_count
V
within_tolerance
V
worse_verdict
V
worst_feature_result
V
worst_verdict

lsh775/moonbit_metrology/cmd/metrology does not have a README file

Source Files

main.mbt

Install

Download zip

Deterministic measurement planning and quality evidence for dimensional inspection.

metrologymeasurementqualityinspection

lsh775

MIT

github.com/lsh775/moonbitMetrology

Updated 2 months ago

36 downloads

Site source Report issue Modules Skills CLI Build queue Statistics